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High-resolution scanning coherent X-ray diffraction microscopy

P. Thibault, M. Dierolf, A. Menzel, O. Bunk and F. Pfeiffer

Published online: 7 juillet 2009

DOI: 10.1051/uvx/2009023

P. Thibault

M. Dierolf

A. Menzel

O. Bunk

F. Pfeiffer

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